Evaluation of thin films using X-ray reflectivity measurement (XRR)
If the membrane structure and composition information is known in advance, multilayer membranes can also be evaluated through simulation!
We would like to introduce our "Thin Film Evaluation using X-ray Reflectivity Measurement (XRR)." X-ray Reflectivity Measurement (XRR) allows us to obtain information about surface (interface) roughness, film density, and film thickness by fitting the X-ray profile, which shows attenuation and interference fringes near total external reflection, with a calculated profile. Please feel free to contact us if you have any inquiries. 【Thin Films that can be Analyzed】 ■Sample Surface: Mirror-like (Surface Roughness less than 5nm) ■Sample Size: 30mm x 30mm or larger *Please consult us if the size is smaller ■Film Thickness: 2nm to 500nm ■Required Information: Film structure and film composition information *For more details, please download the PDF or feel free to contact us.
- Company：東芝ナノアナリシス
- Price：Other
